MySTDF

STDF Professional Analyzer: Pls contact yrwuang@gmail.com

• Analyzer(MySTDF_Pro) :Fail Summary/Pareto/Map/Distribution/Correlation/AI check

• STDF to Excel(MySTDF): Provide Test Num vs Device Parameter Reading & Statitics

Turn Raw STDF Into Yield Intelligence.

The fastest, most reliable STDF analyzer for Semiconductor Test Engineers.

Stop struggling with massive binary files. MySTDF provides instant parsing, deep-dive visualization, and automated reporting—all in one high-performance EDA platform.

Why Engineers are Switching to MySTDF/MySTDF_Pro:

• The Problem: Standard STDF files are bulky, hard to read, and time-consuming to parse. Every minute spent "cleaning" data is a minute lost in production.

• The Solution: MySTDF uses a proprietary multi-threaded engine to open gigabyte-scale logs in seconds, giving you instant visibility into your test results.

1. advanced Wafer Mapping

Visualize binning distribution and parametric trends across the entire wafer. Identify spatial patterns and edge-of-wafer issues with interactive, heat-mapped overlays.

2. Parametric Trend Analysis

Track shift across multiple lots. Our engine automatically flags tests that are drifting toward limit violations, preventing costly yield excursions.

3. Smart Filtering & Search

Don't get lost in the noise. Filter by Site, Head, Test Number, or specific Hard/Soft Bins. MySTDF makes it easy to isolate failures and find the "needle in the haystack."

Accelerate Your Analysis Today.

Join leading semiconductor firms using BestEDA tools to shorten their time-to-market.

Free Trial Available • No Complex Setup • Expert Support